30 search results - page 1 / 6 » FPGA device and architecture evaluation considering process ... |
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
Process variations in nanometer technologies are becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and withindie va...
FPGA
2009
ACM
13 years 12 months ago
2009
ACM
Carbon nanotubes (CNTs), with their unique electronic properties, are promising materials for building nanoscale circuits. In this paper, we present a new CNT-based FPGA architect...
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
DAC
2009
ACM
13 years 12 months ago
2009
ACM
It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction us...
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...