21 search results - page 1 / 5 » Fault Diagnosis in Scan-Based BIST |
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...
DT
2002
13 years 4 months ago
2002