56 search results - page 2 / 12 » FinFETs for nanoscale CMOS digital integrated circuits |
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
: Double-Gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG device...
MR
2007
13 years 4 months ago
2007
CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...
GLVLSI
2008
IEEE
13 years 5 months ago
2008
IEEE
This paper presents a process variation tolerant, SoC ready, 1GS/s, 6 bit flash analog-to-digital converter (ADC) suitable for integration into nanoscale digital CMOS technologie...
GLVLSI
2006
IEEE
13 years 10 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
TIM
2010
12 years 11 months ago
2010
In this paper, a novel low-power design technique is proposed to minimize the standby leakage power in nanoscale CMOS very large scale integration (VLSI) systems by generating the ...