14 search results - page 1 / 3 » Gate delay estimation in STA under dynamic power supply nois... |
ASPDAC
2010
ACM
13 years 3 months ago
2010
ACM
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
DATE
2009
IEEE
14 years 6 days ago
2009
IEEE
— Decoupling capacitors (decaps) are typically used to reduce the noise in the power supply network. Because the delay of gates and interconnects is affected by the supply voltag...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
Deterministic gate delay models have been widely used to find the transition probabilities at the nodes of a circuit for calculating the power dissipation. However, with progress...
VTS
2005
IEEE
13 years 11 months ago
2005
IEEE
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise est...