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ICCAD
2003
IEEE
175views Hardware» more  ICCAD 2003»
14 years 1 months ago
Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Abhishek Singh, Jitin Tharian, Jim Plusquellic
ASPDAC
2004
ACM
112views Hardware» more  ASPDAC 2004»
13 years 10 months ago
Longest path selection for delay test under process variation
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, We...
GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
13 years 9 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham
DATE
2009
IEEE
163views Hardware» more  DATE 2009»
13 years 11 months ago
Fixed points for multi-cycle path detection
—Accurate timing analysis is crucial for obtaining the optimal clock frequency, and for other design stages such as power analysis. Most methods for estimating propagation delay ...
Vijay D'Silva, Daniel Kroening
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
13 years 8 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...