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» High-level test synthesis for delay fault testability
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ISCAS
2003
IEEE
96views Hardware» more  ISCAS 2003»
13 years 10 months ago
A novel improvement technique for high-level test synthesis
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
Saeed Safari, Hadi Esmaeilzadeh, Amir-Hossein Jaha...
ATS
2003
IEEE
151views Hardware» more  ATS 2003»
13 years 10 months ago
BDD Based Synthesis of Symmetric Functions with Full Path-Delay Fault Testability
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...
Junhao Shi, Görschwin Fey, Rolf Drechsler
EURODAC
1994
IEEE
129views VHDL» more  EURODAC 1994»
13 years 9 months ago
Synthesis of Self-Testable Controllers
The paper presents a synthesis approach for pipelinelike controller structures. These structures allow to implement a built-in self-test in two sessions without any extra test reg...
Sybille Hellebrand, Hans-Joachim Wunderlich
DSD
2007
IEEE
87views Hardware» more  DSD 2007»
13 years 11 months ago
On the Construction of Small Fully Testable Circuits with Low Depth
During synthesis of circuits for Boolean functions area, delay and testability are optimization goals that often contradict each other. Multi-level circuits are often quite small ...
Görschwin Fey, Anna Bernasconi, Valentina Cir...
INTEGRATION
2006
102views more  INTEGRATION 2006»
13 years 5 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...