4 search results - page 1 / 1 » IEEE standard 1500 compatible interconnect diagnosis for del... |
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...
ASPDAC
2005
ACM
13 years 7 months ago
2005
ACM
－ We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
SLIP
2005
ACM
13 years 10 months ago
2005
ACM
We propose in this paper a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two ...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...