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ASPDAC
2005
ACM

Oscillation ring based interconnect test scheme for SOC

11 years 7 months ago
Oscillation ring based interconnect test scheme for SOC
- We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and crosstalk glitches. IEEE P1500 wrapper cells are modified. An efficient ring-generation algorithm is proposed to construct ORs based on a graph model. Experimental results on MCNC benchmark circuits show the feasibility of the scheme and the effectiveness of the algorithm. Our method achieves 100% fault coverage with a small number of tests.
Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su,
Added 13 Oct 2010
Updated 13 Oct 2010
Type Conference
Year 2005
Where ASPDAC
Authors Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen
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