3 search results - page 1 / 1 » Improved fault diagnosis in scan-based BIST via superpositio... |
ITC
1997
IEEE
13 years 10 months ago
1997
IEEE
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
DAC
2000
ACM
14 years 7 months ago
2000
ACM
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...