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» Improving cache lifetime reliability at ultra-low voltages
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ISLPED
2009
ACM
132views Hardware» more  ISLPED 2009»
9 years 8 months ago
Enabling ultra low voltage system operation by tolerating on-chip cache failures
Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...
MICRO
2009
IEEE
178views Hardware» more  MICRO 2009»
9 years 8 months ago
Improving cache lifetime reliability at ultra-low voltages
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
Zeshan Chishti, Alaa R. Alameldeen, Chris Wilkerso...
SOCC
2008
IEEE
167views Education» more  SOCC 2008»
9 years 7 months ago
65NM sub-threshold 11T-SRAM for ultra low voltage applications
In this paper a new ultra low power SRAM cell is proposed. In the proposed SRAM topology, additional circuitry has been added to a standard 6T-SRAM cell to improve the static nois...
Farshad Moradi, Dag T. Wisland, Snorre Aunet, Hami...
MICRO
2010
IEEE
132views Hardware» more  MICRO 2010»
8 years 11 months ago
Parichute: Generalized Turbocode-Based Error Correction for Near-Threshold Caches
Energy efficiency is a primary concern for microprocessor designers. A very effective approach to improving the energy efficiency of a chip is to lower its supply voltage to very ...
Timothy N. Miller, Renji Thomas, James Dinan, Bruc...
CODES
2007
IEEE
9 years 7 months ago
On the impact of manufacturing process variations on the lifetime of sensor networks
As an emerging technology, sensor networks provide the ability to accurately monitor the characteristics of wide geographical areas over long periods of time. The lifetime of indi...
Siddharth Garg, Diana Marculescu
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