5 search results - page 1 / 1 » Improving the reliability of on-chip data caches under proce... |
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
On-chip caches take a large portion of the chip area. They are much more vulnerable to parameter variation than smaller units. As leakage current becomes a significant component ...
TVLSI
2008
13 years 4 months ago
2008
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance o...
ISVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In modern circuit design, it is difficult to provide reliable parametric yield prediction since the real distribution of process data is hard to measure. Most existing approaches ...
ASPLOS
1992
ACM
13 years 8 months ago
1992
ACM
We describe and evaluate a strategy for declustering the parity encoding in a redundant disk array. This declustered parity organization balances cost against data reliability and...