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» Interconnect Analysis: From 3-D Structures to Circuit Models
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ICCAD
2003
IEEE
131views Hardware» more  ICCAD 2003»
14 years 2 months ago
A New Surface Integral Formulation For Wideband Impedance Extraction of 3-D Structures
Detailed electromagnetic analysis of three-dimensional structures in multilayered dielectric media is critical for automatic generation of equivalent circuit models for the interc...
Ben Song, Zhenhai Zhu, John D. Rockway, Jacob Whit...
ISQED
2010
IEEE
105views Hardware» more  ISQED 2010»
13 years 9 months ago
Leakage current analysis for intra-chip wireless interconnects
A simulation-based feasibility study of an intra-chip wireless interconnect system is presented. The wireless interconnect system is modelled in a 250 nm standard complementary met...
Ankit More, Baris Taskin
MICRO
2008
IEEE
208views Hardware» more  MICRO 2008»
13 years 11 months ago
Microarchitecture soft error vulnerability characterization and mitigation under 3D integration technology
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
Wangyuan Zhang, Tao Li
ISLPED
2006
ACM
99views Hardware» more  ISLPED 2006»
13 years 11 months ago
Thermal via allocation for 3D ICs considering temporally and spatially variant thermal power
All existing methods for thermal-via allocation are based on a steady-state thermal analysis and may lead to excessive number of thermal vias. This paper develops an accurate and ...
Hao Yu, Yiyu Shi, Lei He, Tanay Karnik
ICIAR
2004
Springer
13 years 10 months ago
Environment Authentication Through 3D Structural Analysis
Abstract. We address the validation of the current sensed environmental state against a model known from earlier perception. Our surface based approach compares 3D range data of a ...
Toby P. Breckon, Robert B. Fisher