232 search results - page 2 / 47 » MicroNetwork-Based Integration for SOCs |
ET
2002
13 years 5 months ago
2002
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
Abstract-- With technology further scaling into deep submicron era, power supply noise become an important problem. Power supply noise problem is getting worse due to serious IR-dr...
DATE
2004
IEEE
13 years 9 months ago
2004
IEEE
Recently a lot of multimedia applications are emerging on portable appliances. They require both the flexibility of upgradeable devices (traditionally software based) and a powerf...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
Abstract--An integrated test scheduling methodology for multiprocessor System-on-Chips (SOC) utilizing the functional buses for test data delivery is described. The proposed method...
TCAD
2002
13 years 4 months ago
2002
Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource c...