47 search results - page 1 / 10 » Minimizing the Impact of Scan Compression |
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
DATE
2009
IEEE
13 years 8 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...