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VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
14 years 4 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
TVLSI
2008
152views more  TVLSI 2008»
13 years 3 months ago
MMV: A Metamodeling Based Microprocessor Validation Environment
With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validati...
Deepak Mathaikutty, Sreekumar V. Kodakara, Ajit Di...
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
13 years 10 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
13 years 10 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
FDL
2007
IEEE
13 years 8 months ago
A Metamodeling based Framework for Architectural Modeling and Simulator Generation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. The informal specification document from which the various collaterals are ...
Deepak Mathaikutty, Ajit Dingankar, Sandeep K. Shu...