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» Modeling Crosstalk Induced Delay
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ET
2002
97views more  ET 2002»
13 years 4 months ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
ITC
2003
IEEE
167views Hardware» more  ITC 2003»
13 years 10 months ago
Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
Rahul Kundu, R. D. (Shawn) Blanton
DAC
2003
ACM
13 years 10 months ago
Crosstalk noise in FPGAs
In recent years, due to rapid advances in VLSI manufacturing technology capable of packing more and more devices and wires on a chip, crosstalk has emerged as a serious problem af...
Yajun Ran, Malgorzata Marek-Sadowska
VTS
2008
IEEE
136views Hardware» more  VTS 2008»
13 years 11 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
GLVLSI
2005
IEEE
99views VLSI» more  GLVLSI 2005»
13 years 10 months ago
An empirical study of crosstalk in VDSM technologies
We perform a detailed study of various crosstalk scenarios in VDSM technologies by using a distributed model of the crosstalk site and make a number of key observations about the ...
Shahin Nazarian, Massoud Pedram, Emre Tuncer