17 search results - page 1 / 4 » Modeling of PMOS NBTI Effect Considering Temperature Variati... |
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
DAC
2006
ACM
13 years 10 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
MICRO
2008
IEEE
13 years 11 months ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...