17 search results - page 3 / 4 » Modeling of PMOS NBTI Effect Considering Temperature Variati... |
ICCAD
2004
IEEE
14 years 2 months ago
2004
IEEE
Thermal effects are becoming a limiting factor in highperformance circuit design due to the strong temperaturedependence of leakage power, circuit performance, IC package cost and...
TVLSI
2010
13 years 13 days ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
ATS
2005
IEEE
13 years 11 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
ISQED
2008
IEEE
14 years 4 days ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
ISQED
2007
IEEE
14 years 1 days ago
2007
IEEE
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...