11 search results - page 1 / 3 » Noise Analysis of Fault Tolerant Active Pixel Sensors |
DFT
2005
IEEE
13 years 10 months ago
2005
IEEE
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...
DFT
2007
IEEE
13 years 11 months ago
2007
IEEE
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
A Fault Tolerant Active Pixel Sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the life...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...