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ITC
1993
IEEE
110views Hardware» more  ITC 1993»
13 years 9 months ago
Novel Test Pattern Generators for Pseudo-Exhaustive Testing
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...
ITC
1989
IEEE
70views Hardware» more  ITC 1989»
13 years 9 months ago
The Pseudo-Exhaustive Test of Sequential Circuits
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
Sybille Hellebrand, Hans-Joachim Wunderlich
SEW
2006
IEEE
13 years 11 months ago
Pseudo-Exhaustive Testing for Software
Pseudo-exhaustive testing uses the empirical observation that, for broad classes of software, a fault is likely triggered by only a few variables interacting. The method takes adv...
D. Richard Kuhn, Vadim Okun
DATE
2003
IEEE
108views Hardware» more  DATE 2003»
13 years 10 months ago
EBIST: A Novel Test Generator with Built-In Fault Detection Capability
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakr...
ET
2000
145views more  ET 2000»
13 years 4 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar