12 search results - page 1 / 3 » On signal tracing in post-silicon validation |
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Today’s complex integrated circuit designs increasingly rely on post-silicon validation to eliminate bugs that escape from presilicon verification. One effective silicon debug ...
ASPDAC
2010
ACM
13 years 2 months ago
2010
ACM
It is increasingly difficult to guarantee the first silicon success for complex integrated circuit (IC) designs. Post-silicon validation has thus become an essential step in the I...