13 search results - page 1 / 3 » On the Reliability Evaluation of SRAM-Based FPGA Designs |
FPL
2005
Springer
13 years 10 months ago
2005
Springer
Benefits of Field Programmable Gate Arrays (FPGAs) have lead to a spectrum of use ranging from consumer products to astronautics. This diversity necessitates the need to evaluate ...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
In this paper we propose a hybrid FPGA using nanoscale clusters with an architecture similar to clusters of traditional CMOS FPGAs. The proposed cluster is made of a crossbar of n...
FPGA
2004
ACM
13 years 10 months ago
2004
ACM
This paper shows a method to verifying the thermal status of complex FPGA-based circuits like microprocessors. Thus, the designer can evaluate if a particular block is working bey...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
— In this paper, an innovative self-checking Reed Solomon encoder architecture is described. The presented architecture exploits some properties of the arithmetic operations in G...