9 search results - page 1 / 2 » Optimized self-tuning for circuit aging |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
We present a framework and control policies for optimizing dynamic control of various self-tuning parameters over lifetime in the presence of circuit aging. Our framework introduc...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
DATE
2009
IEEE
14 years 6 days ago
2009
IEEE
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
MICRO
2008
IEEE
13 years 12 months ago
2008
IEEE
Processors progressively age during their service life due to normal workload activity. Such aging results in gradually slower circuits. Anticipating this fact, designers add timi...
ATS
2009
IEEE
13 years 3 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...