12 search results - page 2 / 3 » Parallel Genetic Algorithms for Simulation-Based Sequential ... |
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
VTS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
COR
2008
2008
Observations in using parallel and sequential evolutionary algorithms for automatic software testing
13 years 5 months ago
In this paper we analyze the application of parallel and sequential evolutionary algorithms (EAs) to the automatic test data generation problem. The problem consists of automatica...
VTS
1996
IEEE
13 years 9 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
EVOW
1999
Springer
13 years 9 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...