Sciweavers

Share
30 search results - page 1 / 6
» Path delay test compaction with process variation tolerance
Sort
View
DAC
2005
ACM
9 years 8 days ago
Path delay test compaction with process variation tolerance
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T...
ASPDAC
2004
ACM
112views Hardware» more  ASPDAC 2004»
9 years 3 months ago
Longest path selection for delay test under process variation
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, We...
DATE
1999
IEEE
127views Hardware» more  DATE 1999»
9 years 2 months ago
Minimizing Sensitivity to Delay Variations in High-Performance Synchronous Circuits
This paper investigates retiming and clock skew scheduling for improving the tolerance of synchronous circuits to delay variations. It is shown that when both long and short paths...
Xun Liu, Marios C. Papaefthymiou, Eby G. Friedman
GLVLSI
2010
IEEE
138views VLSI» more  GLVLSI 2010»
9 years 3 months ago
Methodology to achieve higher tolerance to delay variations in synchronous circuits
A methodology is proposed for designing robust circuits exhibiting higher tolerance to process and environmental variations. This higher tolerance is achieved by exploiting the in...
Emre Salman, Eby G. Friedman
IOLTS
2005
IEEE
141views Hardware» more  IOLTS 2005»
9 years 3 months ago
A Novel On-Chip Delay Measurement Hardware for Efficient Speed-Binning
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
Arijit Raychowdhury, Swaroop Ghosh, Kaushik Roy
books