9 search results - page 1 / 2 » Pattern Selection for Testing of Deep Sub-Micron Timing Defe... |
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...
TCAD
2008
13 years 4 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...