41 search results - page 3 / 9 » Power Supply Noise Analysis Methodology for Deep-Submicron V... |
TC
2008
13 years 6 months ago
2008
On-chip interconnection networks (OCINs) have emerged as a modular and scalable solution for wire delay constraints in deep submicron VLSI design. OCIN research has shown that the ...
VLSID
2008
IEEE
14 years 19 days ago
2008
IEEE
With the shift towards deep sub-micron (DSM) technologies, the increase in leakage power and the adoption of poweraware design methodologies have resulted in potentially significa...
ICCAD
2003
IEEE
14 years 3 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
TCAD
2002
13 years 5 months ago
2002
We develop a general methodology to analyze crosstalk effects that are likely to cause errors in deep submicron high speed circuits. We focus on crosstalk due to capacitive coupli...
GLVLSI
2003
IEEE
13 years 11 months ago
2003
IEEE
The use of multiple supply voltages for energy and average power reduction is well researched and several works have appeared in the literature. However, in low power design using...