55 search results - page 2 / 11 » Reconfigurable scan chains: a novel approach to reduce test ... |
ATS
2004
IEEE
13 years 9 months ago
2004
IEEE
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
ISQED
2010
IEEE
13 years 10 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...