8 search results - page 1 / 2 » RunBasedReordering: A Novel Approach for Test Data Compressi... |
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
ET
2002
13 years 4 months ago
2002
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
DATE
2009
IEEE
13 years 8 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
ET
2002
13 years 4 months ago
2002
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...