7 search results - page 1 / 2 » Selective Hardening of NanoPLA Circuits |
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
Nanoelectronic components are expected to suffer from very high error rates, implying the need for hardening techniques. We propose a fine-grained approach to harden a promising...
ICCD
2008
IEEE
14 years 1 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...