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DSD
2007
IEEE
98views Hardware» more  DSD 2007»
13 years 11 months ago
Fault Diagnosis in Integrated Circuits with BIST
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evart...
ITC
2002
IEEE
86views Hardware» more  ITC 2002»
13 years 9 months ago
Incremental Diagnosis of Multiple Open-Interconnects
With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-lif...
Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Tak...
GLVLSI
2005
IEEE
83views VLSI» more  GLVLSI 2005»
13 years 10 months ago
Diagnosing multiple transition faults in the absence of timing information
As timing requirements in today’s advanced VLSI designs become more aggressive, the need for automated tools to diagnose timing failures increases. This work presents two such a...
Jiang Brandon Liu, Magdy S. Abadir, Andreas G. Ven...
JUCS
2007
95views more  JUCS 2007»
13 years 4 months ago
Using Place Invariants and Test Point Placement to Isolate Faults in Discrete Event Systems
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
Iwan Tabakow
SLIP
2005
ACM
13 years 10 months ago
Multilevel full-chip routing with testability and yield enhancement
We propose in this paper a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two ...
Katherine Shu-Min Li, Chung-Len Lee, Yao-Wen Chang...