9 search results - page 2 / 2 » Stand-by Power Minimization Through Simultaneous Threshold V... |
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
DATE
2009
IEEE
13 years 9 months ago
2009
IEEE
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
Multi-core processors have become an integral part of mainstream high performance computer systems. In parallel, exponentially increasing power density and packaging costs have ne...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
Exponentially rising cooling/packaging costs due to high power density call for architectural and software-level thermal management. Dynamic thermal management (DTM) techniques co...