5 search results - page 1 / 1 » Static Compaction of Delay Tests Considering Power Supply No... |
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise est...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
ICCAD
2003
IEEE
13 years 10 months ago
2003
IEEE
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...