88 search results - page 3 / 18 » Test Selection Based on High Level Fault Simulation for Mixe... |
DAC
2005
ACM
14 years 6 months ago
2005
ACM
In the design of highly complex, heterogeneous, and concurrent systems, deadlock detection and resolution remains an important issue. In this paper, we systematically analyze the ...
VLSI
2005
Springer
13 years 11 months ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
ATS
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
EVOW
2008
Springer
13 years 7 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
GECCO
2004
Springer
13 years 11 months ago
2004
Springer
Abstract. The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural descript...