112 search results - page 2 / 23 » Test generation in VLSI circuits for crosstalk noise |
GLVLSI
2005
IEEE
13 years 11 months ago
2005
IEEE
We perform a detailed study of various crosstalk scenarios in VDSM technologies by using a distributed model of the crosstalk site and make a number of key observations about the ...
ET
2002
13 years 5 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
ICCAD
2003
IEEE
13 years 10 months ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
ISPD
1998
ACM
13 years 9 months ago
1998
ACM
As chip size and design density increase, coupling effects (crosstalk) between signal wires become increasingly critical to on–chip timing and even functionality. A method is pr...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...