4 search results - page 1 / 1 » Testable Design and Testing of MCMs Based on Multifrequency ... |
ATS
1996
IEEE
13 years 10 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
Abstract-- This paper proposes a novel power-aware multifrequency wrapper architecture design to achieve at-speed testability. The trade-offs between power dissipation, scan time a...
ITC
1997
IEEE
13 years 10 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feed...