15 search results - page 2 / 3 » Testing a system-on-a-chip with embedded microprocessor |
ASPDAC
2001
ACM
13 years 9 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
The custom testability strategy of the Alpha 21364, Hewlett-Packard’s most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT feature...
VTS
2007
IEEE
14 years 15 hour ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
RTAS
2009
IEEE
14 years 14 days ago
2009
IEEE
Embedded systems in safety-critical environments demand safety guarantees while providing many useful services that are too complex to formally verify or fully test. Existing appl...
DATE
2004
IEEE
13 years 9 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...