570 search results - page 1 / 114 » The behavior of resistive circuits |
CDC
2009
IEEE
13 years 9 months ago
2009
IEEE
CDC
2010
IEEE
12 years 12 months ago
2010
IEEE
It is shown that just as we did for a purely resistive network [10], that circuit analysis is very simple if the elements are described not by potentials across and currents throug...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
ET
2007
13 years 4 months ago
2007
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...