6 search results - page 1 / 2 » Use of Multiple IDDQ Test Metrics for Outlier Identification |
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
VLSID
2003
IEEE
14 years 5 months ago
2003
IEEE
Increasing values and spread in leakage current makes it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer ...
VTS
2006
IEEE
13 years 10 months ago
2006
IEEE
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to sc...