30 search results - page 3 / 6 » Variability in nanometer CMOS: Impact, analysis, and minimiz... |
GLVLSI
2006
IEEE
14 years 6 days ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
ICCAD
2007
IEEE
14 years 3 months ago
2007
IEEE
— As CMOS technology enters the nanometer regime, the increasing process variation is bringing manifest impact on circuit performance. In this paper, we propose a Principle Hessi...
DAC
2009
ACM
14 years 7 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
GLVLSI
2008
IEEE
14 years 18 days ago
2008
IEEE
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
ISQED
2009
IEEE
14 years 29 days ago
2009
IEEE
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...