8 search results - page 1 / 2 » Weibull Based Analytical Waveform Model |
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Current CMOS technologies are characterized by interconnect lines with increased relative resistance w.r.t. driver output resistance. Designs generate signal waveshapes that are v...
WCE
2007
13 years 6 months ago
2007
— In many applications of failure time data analysis, it is important to perform inferences about the median of the distribution function in situations of failure time data model...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Soft errors have emerged as an important reliability challenge for nanoscale VLSI designs. In this paper, we present a fast and efficient soft error rate (SER) computation algorit...
ISCAS
2005
IEEE
13 years 10 months ago
2005
IEEE
— Based on a Fourier series analysis, an analytic interconnect model is presented which is suitable for periodic signals, such as a clock signal. In this model, the far end time ...
TCAD
2010
13 years 3 months ago
2010
—With the scaling of complementary metal–oxide– semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacit...