35 search results - page 1 / 7 » Yield modelling and Yield Enhancement for FPGAs using Fault ... |
FPL
2005
Springer
13 years 10 months ago
2005
Springer
This paper presents a revised model for the yield analysis of FPGA interconnect layers. Based on proven yield models, this work improves the predictions and assumptions of previous...
FPGA
2006
ACM
13 years 8 months ago
2006
ACM
The high unit cost of FPGA devices often deters their use beyond the prototyping stage. Efforts have been made to reduce the part-cost of FPGA devices, resulting in the developmen...
FPL
2006
Springer
13 years 8 months ago
2006
Springer
As manufacturing technology enters the ultra-deep submicron era, wafer yields are destined to drop due to higher occurrence of physical defects on the die. This paper proposes a y...
FPL
2005
Springer
13 years 10 months ago
2005
Springer
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
attributed to the high regularity of memories, PAs and FPGAs, and the ease with which they can be tested and reconfigured to avoid faulty elements. Digital microfluidicsbased bioch...