MTV
2005
IEEE
13 years 10 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
CEC
2005
IEEE
13 years 10 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
The ever increasing usage of microprocessor devices is sustained by a high volume production that in turn requires a high production yield, backed by a controlled process. Fault d...
ISAAC
2007
Springer
13 years 11 months ago
2007
Springer
This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the ...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
When a test set size is larger than desired, some patterns must be dropped. This paper presents a systematic method to reduce test set size; the method reorders a test set using t...
WACV
2008
IEEE
13 years 11 months ago
2008
IEEE
In this paper we present a system for multi-pose face detection. Our system presents three main contributions. First, we introduce the use of asymmetric Haar features. Asymmetric ...
ICASSP
2008
IEEE
13 years 11 months ago
2008
IEEE
We report results on speaker diarization of French broadcast news and talk shows on current affairs. This speaker diarization process is a multistage segmentation and clustering s...