TVLSI
2008
13 years 4 months ago
2008
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
IFIP
2001
Springer
13 years 8 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
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Ahmed Assayed
Sr. Test Engineer; currently employed at Medtronic Inc.
BS electrical engineering - Zagazig University - Egypt
MS computer engineering - North Dakota State Unive...