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TVLSI
2008
140views more  TVLSI 2008»
9 years 11 months ago
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
Jorge Campos, Hussain Al-Asaad
IFIP
2001
Springer
10 years 4 months ago
Random Adjacent Sequences: An Efficient Solution for Logic BIST
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
René David, Patrick Girard, Christian Landr...
VTS
2002
IEEE
108views Hardware» more  VTS 2002»
10 years 4 months ago
On Using Efficient Test Sequences for BIST
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
René David, Patrick Girard, Christian Landr...

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AhmedEngineer
Medtronic, Inc.
Ahmed
Ahmed Assayed Sr. Test Engineer; currently employed at Medtronic Inc. BS electrical engineering - Zagazig University - Egypt MS computer engineering - North Dakota State Unive...
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