183
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GLVLSI
2010
IEEE
15 years 9 months ago
2010
IEEE
This paper describes a physics-based semi-analytical model for Schottky-barrier carbon nanotube (CNT) and graphene nanoribbon (GNR) transistors. The model includes the treatment o...
188
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GLVLSI
2010
IEEE
15 years 9 months ago
2010
IEEE
Transistor aging effects (NBTI and PBTI) impact the reliability of SRAM in nano-scale CMOS technologies. In this research, the combined effect of NBTI and PBTI on power gated SRAM...
145
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ASPDAC
2008
ACM
15 years 9 months ago
2008
ACM
- Simulation-based functional verification is characterized by two inherently conflicting targets: the signal visibility and simulation performance. Achieving a proper trade-off be...
169
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ASPDAC
2008
ACM
15 years 9 months ago
2008
ACM
The capability of predicting the temperature profile is critically important for timing estimation, leakage reduction, power estimation, hotspot avoidance and reliability concerns ...
185
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ASPDAC
2008
ACM
15 years 9 months ago
2008
ACM
This paper presents a new logic style, named Current-Mode Differential logic (CMDL), that achieves both high operating speed and low power consumption. Inspired by the low-voltage ...