151
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DFT
2004
IEEE
15 years 9 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
167
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DFT
2004
IEEE
15 years 9 months ago
2004
IEEE
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
148
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DFT
2004
IEEE
15 years 9 months ago
2004
IEEE
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
169
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DFT
2004
IEEE
15 years 9 months ago
2004
IEEE
In this paper, a simple codec algorithm based on Reed-Solomon (RS) codes is proposed for erasure correcting in RAID (Redundant Array of Independent Disks) level 6 systems. Unlike ...
144
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DFT
2004
IEEE
15 years 9 months ago
2004
IEEE
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...