140
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DFT
2004
IEEE
15 years 7 months ago
2004
IEEE
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
136
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DFT
2004
IEEE
15 years 7 months ago
2004
IEEE
This paper presents theoretical yet practical methodologies to model, assure and optimize the Reliability of Clockless Wave Pipeline. Clockless wave pipeline is a cutting-edge and...
128
Voted
DFT
2004
IEEE
15 years 7 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
148
Voted
DFT
2004
IEEE
15 years 7 months ago
2004
IEEE
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
127
Voted
DFT
2004
IEEE
15 years 7 months ago
2004
IEEE