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109
Voted
DFT
2004
IEEE
92views VLSI» more  DFT 2004»
15 years 7 months ago
Reliability and Yield: A Joint Defect-Oriented Approach
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
Roman Barsky, Israel A. Wagner
145
Voted
DFT
2004
IEEE
174views VLSI» more  DFT 2004»
15 years 7 months ago
Defect Avoidance in a 3-D Heterogeneous Sensor
A 3D Heterogeneous Sensor using a stacked chip is investigated. Optical Active Pixel Sensor and IR Bolometer detectors are combined to create a multispectral pixel for aligned col...
Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
137
Voted
DFG
2004
Springer
15 years 7 months ago
Modeling and Formal Verification of Production Automation Systems
This paper presents the real-time model checker RAVEN and related theoretical background. RAVEN augments the efficiency of traditional symbolic model checking with possibilities to...
Jürgen Ruf, Roland J. Weiss, Thomas Kropf, Wo...
132
Voted
DFG
2004
Springer
15 years 7 months ago
A Formal Component Concept for the Specification of Industrial Control Systems
Abstract. Motivated by the wide acceptance of component based technologies in software development, a component concept for software engineering is applied to modeling in the field...
Benjamin Braatz, Markus Klein, Gunnar Schröte...
145
Voted
DFG
2004
Springer
15 years 7 months ago
Verification of PLC Programs Given as Sequential Function Charts
Programmable Logic Controllers (PLC) are widespread in the manufacturing and processing industries to realize sequential procedures and to avoid safety-critical states. For the spe...
Nanette Bauer, Sebastian Engell, Ralf Huuck, Sven ...