170
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DAC
2000
ACM
16 years 8 months ago
2000
ACM
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
178
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DAC
2000
ACM
16 years 8 months ago
2000
ACM
We investigate the differences in speed between applicationspecific integrated circuits and custom integrated circuits when each are implemented in the same process technology, wi...
208
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DAC
2000
ACM
16 years 8 months ago
2000
ACM
A main advantage of control composition with modal processes [4] is the enhanced retargetability of the composed behavior over a wide variety of target architectures. Unlike previ...
187
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DAC
2000
ACM
16 years 8 months ago
2000
ACM
We propose practical iterated methods for layout density control for CMP uniformity, based on linear programming, Monte-Carlo and greedy algorithms. We experimentally study the tr...
184
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DAC
2000
ACM
16 years 8 months ago
2000
ACM
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...