Sciweavers

ITC
2002
IEEE

A New Test Generation Approach for Embedded Analogue Cores in SoC

13 years 11 months ago
A New Test Generation Approach for Embedded Analogue Cores in SoC
M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T
Added 15 Jul 2010
Updated 15 Jul 2010
Type Conference
Year 2002
Where ITC
Authors M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff
Comments (0)