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108

ITC
2002
IEEE

127views Hardware» more ITC 2002»

A New Test Generation Approach for Embedded Analogue Cores in SoC

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A New Test Generation Approach for Embedded Analogue Cores in SoC

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M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T

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Added	15 Jul 2010
Updated	15 Jul 2010
Type	Conference
Year	2002
Where	ITC
Authors	M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff

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